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A BER-Suppressed PUF With an Amplification of Process Mismatch Effect in an Oscillator Collapse Topology.
Jaehan Park
ByungJun Kim
Jae-Yoon Sim
Published in:
IEEE J. Solid State Circuits (2022)
Keyphrases
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error rate
process model
database
data mining
artificial intelligence
multiresolution
computer simulation
topology preserving