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Semantic Integrity Measurement of Industrial Control Embedded Devices Based on National Secret Algorithm.

Xiao ZhangLongyun QiXiaolei MaWei LiuLianwen SunXiangnan LiBinbin DuanSiyuan ZhangXin Che
Published in: ICCC Workshops (2023)
Keyphrases
  • computational complexity
  • dynamic programming
  • low cost
  • multi dimensional
  • embedded devices
  • high efficiency
  • data sets
  • optimal solution
  • np hard
  • context aware