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Semantic Integrity Measurement of Industrial Control Embedded Devices Based on National Secret Algorithm.
Xiao Zhang
Longyun Qi
Xiaolei Ma
Wei Liu
Lianwen Sun
Xiangnan Li
Binbin Duan
Siyuan Zhang
Xin Che
Published in:
ICCC Workshops (2023)
Keyphrases
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computational complexity
dynamic programming
low cost
multi dimensional
embedded devices
high efficiency
data sets
optimal solution
np hard
context aware