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Embedded measurement system for non-destructive testing using new eddy currents planar array probe.
Ruben Abrantes
Luis S. Rosado
Pedro M. Ramos
Moisés Piedade
Published in:
I2MTC (2014)
Keyphrases
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embedded systems
neural network
single point
databases
computer vision
multiscale
image registration
digital images
line drawings
programmable logic