New Interference Technique for Determination of Low Loss Material Permittivity in the Extremely High Frequency Range.
Nazariy A. AndrushchakIvan D. KarbovnykKonrad GodziszewskiYevhen YashchyshynMykhailo V. LoburAnatoliy S. AndrushchakPublished in: IEEE Trans. Instrum. Meas. (2015)
Keyphrases
- high frequency
- low frequency
- visual quality
- high resolution
- wavelet transform
- subband
- high frequencies
- low pass
- discrete wavelet transform
- low spatial resolution
- wavelet coefficients
- wavelet decomposition
- frequency band
- multiscale
- multi resolution analysis
- high frequency components
- frequency domain
- phase shifting
- image quality
- similarity measure
- low and high frequency