An Area-Efficient, Low-VDD, Highly Reliable Multi-Cell Antifuse System Fully Operative in DRAMs.
Jong-Pil SonJin Ho KimWoo Song AhnSeung Uk HanSatoru YamadaByung-Sick MoonChuroo ParkHong-Sun HwangSeong-Jin JangJoo-Sun ChoiYoung-Hyun JunSoo-Won KimPublished in: IEICE Trans. Electron. (2011)