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OpenMP与环形缓冲技术在TFT-LCD缺陷检测中的应用 (Application of Open MP and Ring Buffer Technology in Defects Detection of Glass Substrate).
Haibing Hu
Ting Xu
Bo Zhang
Dongjian Xu
Shiqun Jin
Rongsheng Lu
Published in:
计算机科学 (2019)
Keyphrases
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thin film transistor
image sequences
text mining
decision makers
tft lcd