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High Moisture Resistant and Reliable Gate Structure Design in High Power pHEMTs for Millimeter-Wave Applications.

Hirotaka AmasugaToshihiko ShigaMasahiro TotsukaSeiki GotoAkira Inoue
Published in: IEICE Trans. Electron. (2008)
Keyphrases
  • high power
  • low power
  • real time
  • multiscale
  • multiresolution
  • high resolution
  • cost effective
  • millimeter wave