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High Moisture Resistant and Reliable Gate Structure Design in High Power pHEMTs for Millimeter-Wave Applications.
Hirotaka Amasuga
Toshihiko Shiga
Masahiro Totsuka
Seiki Goto
Akira Inoue
Published in:
IEICE Trans. Electron. (2008)
Keyphrases
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high power
low power
real time
multiscale
multiresolution
high resolution
cost effective
millimeter wave