Special Issue on Testability and Dependability of Artificial Intelligence Hardware.
Fei SuChunsheng LiuHaralampos-G. StratigopoulosPublished in: IEEE Des. Test (2023)
Keyphrases
- special issue
- artificial intelligence
- applied intelligence
- ambient intelligence
- ai edam
- international journal
- ecml pkdd
- low cost
- special section
- intelligent systems
- hardware and software
- real time
- cognitive science
- computer systems
- computational intelligence
- expert systems
- complex systems
- computer science
- software engineering
- massively parallel
- knowledge representation
- higher education
- hardware implementation
- computer architecture
- machine learning
- databases
- natural language processing