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Scanner Model Identification of Official Documents Using Noise Parameters Estimation in the Wavelet Domain.

Chaima Ben RabahGouenou CoatrieuxRiadh Abdelfattah
Published in: ACIVS (2018)
Keyphrases
  • parameters estimation
  • statistical model
  • probabilistic model
  • parameter estimation
  • wavelet domain
  • high level
  • generalized gaussian
  • high quality
  • co occurrence
  • maximum likelihood
  • em algorithm