Login / Signup

Accurate analog/RF BIST evaluation based on SVM classification of the process parameters.

Ahcène BounceurBelkacem BrahmiKamel BezniaReinhardt Euler
Published in: IDT (2014)
Keyphrases
  • svm classification
  • neural network
  • expectation maximization
  • data sets
  • clustering algorithm
  • text mining
  • maximum likelihood