Electrical Characterization of the Clamping Behavior on CMOS Quasi-Floating-Gate Circuits.
Jesus E. Molinar-SolisDaniel Sanchez-AriasDaniel Fajardo-DelgadoJuan Jesús Ocampo HidalgoIvan R. Padilla-CantoyaPublished in: J. Circuits Syst. Comput. (2024)