A Method for Measuring Parameters of Defective Ellipse Based on Vision.
He ZhangLi WangWenya LiuJiwen CuiJiubin TanPublished in: Sensors (2023)
Keyphrases
- computer vision
- sensitivity analysis
- high precision
- synthetic data
- dynamic programming
- cost function
- maximum likelihood estimation
- neural network
- support vector machine svm
- maximum likelihood
- high accuracy
- experimental evaluation
- prior knowledge
- classification accuracy
- support vector machine
- computational cost
- vision system
- significant improvement
- parameter estimation
- optimization algorithm
- detection algorithm
- clustering method
- pairwise
- optimization method
- preprocessing
- objective function