REEM: Failure/non-failure region estimation method for SRAM yield analysis.
Manish RanaRamon CanalPublished in: ICCD (2014)
Keyphrases
- high accuracy
- preprocessing
- experimental evaluation
- statistical analysis
- detection method
- clustering method
- grey level
- error analysis
- estimation algorithm
- high precision
- synthetic data
- computationally efficient
- support vector machine
- dynamic programming
- evolutionary algorithm
- monte carlo simulation
- color images
- similarity measure