Comments on "Researcher Bias: The Use of Machine Learning in Software Defect Prediction".
Chakkrit TantithamthavornShane McIntoshAhmed E. HassanKenichi MatsumotoPublished in: IEEE Trans. Software Eng. (2016)
Keyphrases
- software defect prediction
- machine learning
- sample selection bias
- ensemble learning
- feature ranking
- machine learning methods
- pattern recognition
- active learning
- data mining
- inductive bias
- machine learning algorithms
- learning tasks
- feature selection
- text mining
- text classification
- model selection
- unlabeled data
- benchmark datasets
- supervised learning
- training set
- reinforcement learning
- learning algorithm
- neural network