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A New Approach to Validate GaN FET Reliability to Power-Line Surges Under Use-Conditions.

Sandeep R. BahlPaul Brohlin
Published in: IRPS (2019)
Keyphrases
  • power line
  • tree crown
  • low voltage
  • sufficient conditions
  • real time
  • digital images
  • intelligent tutoring systems
  • ecg signals