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Evolution of C-V and I-V characteristics for a commercial 600 V GaN GIT power device under repetitive short-circuit tests.
Jian-Zhi Fu
François Fouquet
Moncef Kadi
Pascal Dherbécourt
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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short circuit
thin film
power consumption
evolutionary algorithm
computer vision
rough sets
experimental data