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A Genetic Testing Framework for Digital Integrated Circuits.

Xiaoming YuAlessandro FinFranco FummiElizabeth M. Rudnick
Published in: ICTAI (2002)
Keyphrases
  • integrated circuit
  • main contribution
  • probabilistic model
  • lightweight
  • data sets
  • machine learning
  • genetic algorithm
  • multimedia
  • digital libraries
  • evolutionary algorithm
  • test set
  • bayesian framework