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Analysis of InAs-Si heterojunction nanowire tunnel FETs: Extreme confinement vs. bulk.

Hamilton Carrillo-NunezMathieu LuisierAndreas Schenk
Published in: ESSDERC (2014)
Keyphrases
  • image analysis
  • wireless sensor networks
  • neural network
  • multiscale
  • relational databases
  • user interface
  • statistical analysis