An effective capacitance model for computing the electronic properties of charged defects in crystals.
Tzu-Liang ChanAlex J. LeeJames R. ChelikowskyPublished in: Comput. Phys. Commun. (2014)
Keyphrases
- probabilistic model
- computational model
- data sets
- formal model
- process model
- high speed
- parameter estimation
- low power
- simulation model
- sensitivity analysis
- hierarchical structure
- statistical model
- mathematical model
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- electronic commerce
- probability distribution
- prior knowledge
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- bayesian networks
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- neural network