Login / Signup

Scanning electron microscope based stereo analysis [for semiconductor IC inspection].

Ali E. KayaalpA. Ravishankar RaoRamesh C. Jain
Published in: CVPR (1989)
Keyphrases
  • statistical analysis
  • scanning electron microscope
  • early vision
  • neural network
  • computer vision
  • case study
  • artificial neural networks
  • stereo vision