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Measuring Nonlinear Differential RF Amplifiers Using One Single-Ended Source.

Yves RolainWendy Van MoerJohan SchoukensRik Pintelon
Published in: IEEE Trans. Instrum. Meas. (2007)
Keyphrases
  • single source
  • artificial intelligence
  • data mining
  • image processing
  • expert systems
  • multiresolution
  • mobile robot
  • dimensionality reduction
  • multiple sources
  • nonlinear models
  • radio frequency