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"3-2-1" PMP: Adding an Extra Pattern to Dual-Band Phase Shift Profilometry for Higher Precision 3-D Imaging.

Jian WangGuanyu ZhangWei GuoJun ZhangZonghua ZhangLiangzhou ChenTukun LiXiangqian Jiang
Published in: IEEE Trans. Instrum. Meas. (2024)
Keyphrases
  • phase shift
  • waveguide
  • dual band
  • narrow band
  • image processing
  • multiscale
  • viewpoint
  • multiresolution