Login / Signup

NBTI-induced circuit aging optimization by protectability-aware gate replacement technique.

Guimao ZhangMaoxiang YiYong MiaoDawen XuHuaguo Liang
Published in: LATS (2015)
Keyphrases
  • optimization process
  • optimization problems
  • database
  • database systems
  • combinatorial optimization
  • global optimization
  • cmos technology
  • multiple input