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Deep Learning for Smart Industry: Efficient Manufacture Inspection System With Fog Computing.

Liangzhi LiKaoru OtaMianxiong Dong
Published in: IEEE Trans. Ind. Informatics (2018)
Keyphrases
  • deep learning
  • unsupervised learning
  • single image
  • machine learning
  • higher order
  • deep architectures
  • unsupervised feature learning
  • multiscale
  • pattern recognition