Vertical GaN Diode BV Maximization through Rapid TCAD Simulation and ML-enabled Surrogate Model.
Albert LuJordan MarshallYifan WangMing XiaoYuhao ZhangHiu Yung WongPublished in: CoRR (2022)
Keyphrases
- mathematical model
- simulation model
- high level
- image processing
- objective function
- probabilistic model
- probability distribution
- formal model
- experimental data
- parameter estimation
- mathematical analysis
- data sets
- agent model
- process model
- theoretical analysis
- em algorithm
- maximum likelihood
- management system
- image segmentation