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Non-contact Measurements of Size and Charge Distributions of Submicron Particles using an ESPART Analyzer.
P. K. Srirama
J. W. Stark
J. Zhang
Malay K. Mazumder
Published in:
IAS (2007)
Keyphrases
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exponential distributions
probability distribution
real time
similarity measure
data structure
computational complexity
high speed
low power
space complexity
measurement noise
vlsi circuits