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Non-contact Measurements of Size and Charge Distributions of Submicron Particles using an ESPART Analyzer.

P. K. SriramaJ. W. StarkJ. ZhangMalay K. Mazumder
Published in: IAS (2007)
Keyphrases
  • exponential distributions
  • probability distribution
  • real time
  • similarity measure
  • data structure
  • computational complexity
  • high speed
  • low power
  • space complexity
  • measurement noise
  • vlsi circuits