Login / Signup

Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes.

Zhen WangMark G. KarpovskyKonrad J. Kulikowski
Published in: J. Electron. Test. (2010)
Keyphrases
  • error correction
  • error detection and correction
  • design process
  • information systems
  • user interface
  • data processing
  • associative memory