A Simple Prediction Method for Chip-Level Electromigration Lifetime Using Generalized Gamma Distribution.
Shinji YokogawaKyosuke KuniiPublished in: IRPS (2019)
Keyphrases
- clustering method
- pairwise
- classification method
- detection method
- normal distribution
- significant improvement
- cost function
- support vector machine
- image segmentation
- computational cost
- probability distribution
- prediction error
- correlation coefficient
- high precision
- synthetic data
- feature set
- high accuracy
- data sets
- dynamic programming
- wireless sensor networks
- objective function
- feature extraction
- decision trees
- genetic algorithm