Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation Tests.
Jong In ParkSuk Joo BaePublished in: IEEE Trans. Reliab. (2010)
Keyphrases
- light emitting diodes
- preprocessing
- prediction accuracy
- benchmark datasets
- machine learning methods
- viewpoint
- spatio temporal
- significant improvement
- digital images
- data mining techniques
- neural networks and support vector machines
- predictive model
- synthetic and real images
- multi view
- data sets
- object recognition
- image processing