TLEL: A two-layer ensemble learning approach for just-in-time defect prediction.
Xinli YangDavid LoXin XiaJianling SunPublished in: Inf. Softw. Technol. (2017)
Keyphrases
- ensemble learning
- defect prediction
- generalization ability
- software repositories
- ensemble methods
- ensemble classifier
- software projects
- mutual subspace method
- concept drift
- random forest
- base classifiers
- data mining
- support vector machine svm
- multi class
- pairwise
- non stationary
- source code
- knowledge discovery
- bayesian networks
- feature selection