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Power supply transient signal analysis for defect-oriented test.
James F. Plusquellic
Abhishek Singh
Chintan Patel
Anne E. Gattiker
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2003)
Keyphrases
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power supply
signal analysis
signal processing
multiresolution
empirical mode decomposition
wavelet decomposition
intelligent control
high frequency
median filter
real time
feature extraction
computer vision
image processing
non stationary
wavelet coefficients