ESD issues in advanced CMOS bulk and FinFET technologies: Processing, protection devices and circuit strategies.
Christian RussPublished in: Microelectron. Reliab. (2008)
Keyphrases
- high speed
- circuit design
- analog vlsi
- human factors
- intellectual property rights
- advanced technologies
- web intelligence
- delay insensitive
- low cost
- real time
- emerging trends
- vlsi circuits
- information processing
- focal plane
- technical issues
- processing capabilities
- emerging technologies
- power consumption
- image sensor
- intelligent environments
- communication technologies
- hand held devices
- smart phones
- cmos technology
- mobile devices
- legal issues
- technical solutions
- data mining
- semiconductor devices
- control system
- data processing
- low voltage
- information security
- power dissipation
- privacy protection
- design considerations