A new built-in self-test approach for digital-to-analog and analog-to-digital converters.

Karim Arabi Bozena Kaminska Janusz Rzeszut

Published in: ICCAD (1994)

Keyphrases

circuit design
mixed signal
printed circuit
data conversion
cmos image sensor
databases
high speed
multi channel
case study
multiscale
expert systems
analog vlsi
delta sigma