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A Scan-Based Lower-Power Testing Architecture for Modern Circuits.

Jiann-Chyi RauJia-Xiang Wang
Published in: ISPACS (2021)
Keyphrases
  • power consumption
  • analog vlsi
  • management system
  • chip design
  • real time
  • software architecture
  • power management
  • data sets
  • genetic algorithm
  • architectural design
  • master slave
  • multithreading
  • scan data