A normalized-area measure for VLSI layouts.

Musaravakkam S. Krishnan John P. Hayes

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1988)

Keyphrases

similarity measure
evaluation measures
vlsi circuits
distance measure
database
data sets
databases
decision trees
three dimensional
data structure
information technology
artificial neural networks
high speed
vlsi design