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Comparing fail-safe microcontroller architectures in light of IEC 61508.

Riccardo MarianiPeter Fuhrmann
Published in: DFT (2007)
Keyphrases
  • control system
  • low cost
  • distributed systems
  • database
  • process control
  • real world
  • computer vision
  • bayesian networks
  • multiscale
  • fuzzy logic
  • single image
  • parallel architectures