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Impact of bias condition on 1/f noise of dual-gate depletion type MOSFET in linear region and consequences for noise diagnostic application and modelling.
Mirjana S. Videnovic-Misic
M. M. Jevtic
Published in:
Microelectron. Reliab. (2008)
Keyphrases
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noisy data
signal to noise ratio
noise reduction
image structure
noise level
additive noise
gaussian noise
noise model
image noise
noise sensitivity
missing data
noise free
measurement error