Login / Signup
GIDL Increase Due to HCI Stress: Correlation Study of MOSFET Degradation Parameters and Modelling for Reliability Simulation.
Edoardo Ceccarelli
Kevin Manning
Seamus Maxwell
Colm Heffernan
Published in:
IRPS (2019)
Keyphrases
</>
human computer interaction
neural network
simulation study
database
human factors
case study
numerical simulations
empirical studies
correlation analysis
simulation environment
parameter settings
parameter estimation
evolutionary algorithm
information technology
image sequences
website
information systems
real time