A New Method to Extract Mobility Degradation and Parasitic Series Resistance of Nano-scaled MOSFETs.
Zixuan YangQian XieQiao HeMeng ZhaoZheng WangPublished in: ICTA (2021)
Keyphrases
- high accuracy
- experimental evaluation
- objective function
- synthetic data
- detection method
- main contribution
- significant improvement
- high precision
- clustering method
- theoretical analysis
- support vector machine
- computational cost
- pairwise
- preprocessing
- cost function
- prior knowledge
- detection algorithm
- computational complexity
- support vector
- matching algorithm
- image processing