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Circuit-level NBTI macro-models for collaborative reliability monitoring.
Basab Datta
Wayne P. Burleson
Published in:
ACM Great Lakes Symposium on VLSI (2010)
Keyphrases
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monitoring system
artificial intelligence
probabilistic model
high speed
higher level
statistical model
experimental data
statistical models
real time
machine learning
case study
model selection
geographically dispersed