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Six-port reflectometer with tunable parameters ensuring measurement accuracy enhancement.
Kamil Staszek
Jakub Sorocki
Krzysztof Wincza
Slawomir Gruszczynski
Published in:
WiSNet (2017)
Keyphrases
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tunable parameters
high accuracy
prediction accuracy
machine learning
computer vision
image processing
error rate
correlation coefficient
highly accurate
data sets
neural network
computational cost
predictive accuracy
improved accuracy
measurement error