An Automated Scanning Transmission Electron Microscope Guided by Sparse Data Analytics.
Matthew OlsztaDerek HopkinsKevin R. FiedlerMarjolein OostromSarah AkersSteven R. SpurgeonPublished in: CoRR (2021)
Keyphrases
- electron microscope
- data analytics
- three dimensional
- x ray
- noise level
- big data
- business intelligence
- open source
- cloud computing
- high dimensional
- data analysis
- image processing
- query language
- sparse representation
- keyword search
- unstructured data
- internet search
- real world
- data mining techniques
- database
- noisy images
- data mining
- low dose