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Trap detection in electrically stressed AlGaN/GaN HEMTs using optical pumping.

David J. CheneyRick DeistBrent P. GilaJennilee NavalesFan RenStephen J. Pearton
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • automatic detection
  • detection method
  • detection accuracy
  • false positives
  • object detection
  • neural network
  • data mining
  • artificial intelligence
  • intrusion detection
  • false alarms
  • target detection
  • solid state