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Editorial for EAIT issue 3, 2021.

Arthur Tatnall
Published in: Educ. Inf. Technol. (2021)
Keyphrases
  • special issue
  • information systems
  • feature extraction
  • data model
  • database
  • pattern recognition
  • pairwise
  • high dimensional
  • support vector machine
  • small number
  • data management