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A virtual instrument design for low-cost charge-pumping characterization of integrated MOSFETs.

Jailene HernandezJohan CastrillonManuel JimenezAngel De La TorrePedro EscalonaRogelio Palomera
Published in: LATS (2015)
Keyphrases
  • virtual instrument
  • low cost
  • single chip
  • monitoring system
  • three dimensional
  • design process
  • real time
  • learning environment
  • low power