On generalized knowledge measure and generalized accuracy measure with applications to MADM and pattern recognition.
Surender SinghSonam SharmaAbdul Haseeb GaniePublished in: Comput. Appl. Math. (2020)
Keyphrases
- pattern recognition
- machine learning
- similarity measure
- domain knowledge
- relative entropy
- knowledge discovery
- support vector
- expert systems
- confusion matrix
- real time
- correlation coefficient
- computational efficiency
- knowledge based systems
- knowledge acquisition
- distance measure
- image processing
- neural network
- high accuracy
- data mining techniques
- knowledge representation
- image quality
- classification accuracy
- background knowledge
- computer vision
- information theory
- highly accurate
- databases
- data sets