A scalable curve-fit model of the substrate coupling resistances for IC design.
Vijaya Kumar GurugubelliShreepad KarmalkarPublished in: ISQED (2012)
Keyphrases
- metamodel
- high level
- probabilistic model
- formal model
- cost function
- conceptual model
- mathematical model
- computational model
- design space
- case study
- integrated circuit
- theoretical framework
- theoretical analysis
- expectation maximization
- least squares
- software engineering
- management system
- probability distribution
- prior knowledge
- user interface
- similarity measure