Fast S-Parameter TAN Model of n-Port Lumped Structures.
C. CholachueBlaise RaveloA. SimoensA. FathallahPublished in: IEEE Access (2019)
Keyphrases
- mathematical model
- data sets
- formal model
- experimental data
- em algorithm
- parameter estimation
- network model
- parameter values
- neural network model
- statistical model
- computational model
- management system
- probability distribution
- probabilistic model
- artificial neural networks
- multi agent
- objective function
- information retrieval