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Automatic Artefact Removal from Event-related Potentials via Clustering.

Nicoletta NicolaouSlawomir J. Nasuto
Published in: J. VLSI Signal Process. (2007)
Keyphrases
  • event related potentials
  • clustering method
  • k means
  • clustering algorithm
  • fully automatic
  • cluster analysis
  • multiscale
  • pattern recognition
  • principal component analysis