Spur-Free Multirate All-Digital PLL for Mobile Phones in 65 nm CMOS.
Robert Bogdan StaszewskiKhurram WaheedFikret DulgerOren E. EliezerPublished in: IEEE J. Solid State Circuits (2011)
Keyphrases
- mobile phone
- metal oxide semiconductor
- cmos image sensor
- circuit design
- mobile devices
- low cost
- smart phones
- mobile learning
- mobile applications
- mobile users
- cmos technology
- mobile technologies
- integrated circuit
- cellular phone
- silicon on insulator
- power consumption
- mobile phone users
- high speed
- nm technology
- low power
- m learning
- subband
- spatial data
- e learning
- higher education
- wireless sensor networks